AFM platform with optical microscope
Achieves high-speed scanning and high resolution imaging using atomic force microscopy. Compatible with measurements in air and liquid.
This is an AFM platform equipped with an optical microscope. It allows imaging with an atomic force microscope targeting areas observed with the optical microscope. It adopts a vertical optical path design, and the gas-liquid dual-use probe holder can be used simultaneously in both air and liquid. (Liquid measurement option required) *For more details, please contact us.*
- Company:日本レーザー
- Price:Other